Sem/eds analysis company with Microvisionlabs.com? ?MicroVision Labs is owned and operated by a career microscopist, John Knowles, who understands the needs of our clients. Our emphasis on helping our clients solve problems, not just providing data, sets us apart from other labs. We have the technology and knowledge to find answers to your most difficult challenges, helping you succeed at every step. Can I come in to see my samples analyzed? Yes, our clients are always welcome to come in while their samples are being analyzed. For much of the work we do, it is mutually beneficial for our clients to be present to help direct their project since they can provide expertise about their samples. Some of the services we provide such as polished cross sections have time consuming steps making it impractical for a client to stay to watch everything. In those cases it is recommended that you come in initially to explain what you need done and come back at a later time to see the finished product.
The profile of the flow of the solder at these bonds was documented using the SEM with backscatter imaging, which correlates brightness in the image with atomic density. Some voids were found in the solder as shown the SEM image. An EDS spectrum of the solder was acquired which showed that the solder was a tin/lead (80/20) solder. The EDS map clearly shows the copper wire and copper pad (red) with the tin lead solder (light blue) that appears to have flowed well and made a good bond between the copper elements. This map also shows the fiberglass bundles that add structural integrity to the board. See more info at this website.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
Do you do any animal testing? No. Do you analyze any tissue samples or blood samples? No. We do not do any blood analyses and we are not set up to prepare tissue samples. What are some of the cool samples you have looked at under the scanning electron microscope? We have seen 10,000 year old Wolly Mammoth hair, meteorites, an artificial heart valve, civil war bullets, insulin pumps, rare colonial coins, a kidney stone, and a few things we can’t talk about. But some of the more mundane samples, like wood or salt crystals, have proven to be extremely interesting subjects to image.
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. Discover additional info on this website.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.