Particle size analysis services in Chelmsford? MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile.
The scan from left to right shows a high tin concentration (green line) while areas of higher lead concentrations (blue line) were not intersected by the line scan. At the interface between the tin/lead solder and copper (red line), there is a mixture of the solder and copper which is the intermetallic layer. The EDS Map provides a nice visual mixture of colors which shows the intermetallic layer while the line scan clearly shows the intermetallic with the elemental graph. Read a few more info at microvision lab.
The data indicated that a significant portion of the dust was from the insulation in the attic. The contractor had replaced a portion of duct work running to the master bedroom. During this replacement, fiberglass insulation was knocked into the ducting. The small glass insulation fibers were spread through the AC ducts and settling out of the air throughout the house. The client was relieved to know what was causing their skin irritation and the significant dust build up. Using the results garnered from the analysis from MicroVision Labs they were able to have the contractor clean out the duct work and act to prevent further spread of the insulation fibers and properly clean up the settled dust in the house that was the cause of the homeowner’s skin irritation.
Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number.
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. Read even more details at https://microvisionlabs.com/.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.